X-Ray Diffraction & Elemental Analysis
X-ray Diffraction (XRD) and Scattering
Non-destructive Characterization of Material Properties
Bruker’s X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include:
- Phase Identification
- Quantitative Analysis
- Crystal structure determination
- PDF analysis (total scattering)
- Small Angle X-Ray Scattering (SAXS)
- X-Ray Reflectometry (XRR)
- High Resolution X-Ray Diffraction (HRXRD)
- Reciprocal Space Mapping (RSM)
- Residual Stress
- Texture (pole figures)
X-ray Fluorescence (XRF)
Elemental Analysis, Process and Quality Control
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
XRF combines highest accuracy and precision with simple and fast sample preparation for the analysis of elements from Beryllium (Be) to Uranium (U) in the concentration range from 100 % down to the sub-ppm-level.
Energy dispersive X-ray fluorescence (EDXRF) is the best choice for dedicated applications in quality and process control with demands for ease of use and compact size. It delivers analytical flexibility for research and monitoring tasks.
Wavelength dispersive X-ray fluorescence spectrometry (WDXRF) is known for its unrivalled accuracy, precision and reliability. This robust analytical technology has made its way into all kinds of industrial applications, such as cement, polymers, refineries, mining, and industrial minerals.